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Metrology


Woollam Ellipsometer WVASE32  

The WVASE32 is a variable angle (60–90 degrees) spectroscopic ellipsometer. Measurements are performed in the wavelength range 420nm – 780 nm. This tool is used to determine thin film thickness and optical constants. The software supports data modeling and fitting for single film problems to complex multi-layer samples


Filmetrics F20  

A reflectance spectrometer for measuring the thickness and optical constants (n and k) of thin dielectric films and multi-layers.



 

                 
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