Metrology

Woollam Ellipsometer WVASE32
The WVASE32 is a variable angle (60–90 degrees) spectroscopic ellipsometer. Measurements are performed in the wavelength range 420nm – 780 nm. This tool is used to determine thin film thickness and optical constants. The software supports data modeling and fitting for single film problems to complex multi-layer samples

Filmetrics F20
A reflectance spectrometer for measuring the thickness and optical constants (n and k) of thin dielectric films and multi-layers.